iTIME - Timing Analysis
Features
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Cell based statistical static timing analysis tool
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Self timed design margin computation and identification including statistical variations
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Handles special circuits and bidirectional memory structures (like precharge, column multiplexers, low swing sense amplifiers etc.)
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MIN and MAX timing based on iCHAR cell characterization
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Slack report generation and graphical analysis engine
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Mean, sigma and variance of critical paths
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Accurate and reliable analysis
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Critical path spice level netlist generation with sensitization
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Selective spicing of some of the critical paths on demand
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Fast computation through efficient distribution algorithm
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For modern technologies transistor characteristics vary 15% to 25% based on the well proximity effect ( WPE ) and layout proximity effects( LPE ) alone. iTIME gives accurate results by using the appropriate timing information for each leaf cell instance based on its unique proximity.
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Generates industry standard plug'n play timing views for seamless integration at the chip level while giving accurate timing number for every bit.
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Generates power views.
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Special internal extensions for low swing memory specific circuits
Schedule
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no manual Critical path based simulation needed to verify timing and margins. In case of doubt, you can use the pruned netlists generated for every critical path.
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Highly multi-threaded software to maximum usage of machine time.
Engineering
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Internal paths of memory are analyzed and slack is reported.
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Statistical analysis of ALL paths facilitates predicting the 'yield curve' and speed binning of N number of parts.
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Power views.